Resonant Inelastic X-ray Scattering (RIXS)

Resonant Inelastic X-ray Scattering (RIXS) is a powerful technique to focus in on the properties of the specific electrons that participate in giving a material its electronic nature (near Fermi-level conduction band levels). RIXS has undergone rapid and significant development over the past decade or two due to technological advancements allowing for much brighter source x-rays and spectroscopic resolution. The simulation and guides introduce you to the technique and discuss how it has been used to determine the electronic and magnetic states in high-Tc superconductors.

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Student guide - high school level

Student guide - Intermediate undergraduate level

Student guide - Advanced undergraduate

Student guide - graduate level